Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387318 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen +6 more | 2025-08-12 |
| 12243218 | Method and system for scanning wafer | Pei-Hsuan Lee, Chien-Hsiang Huang, Kuan-Hsin Chen, Chun-Chieh Chin | 2025-03-04 |
| 11984365 | Semiconductor structure inspection using a high atomic number material | Pei-Hsuan Lee, Hung-Ming Chen, Yu-Hsiang Cheng, Xiaomeng Chen | 2024-05-14 |
| 11900586 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen +6 more | 2024-02-13 |
| 11783469 | Method and system for scanning wafer | Pei-Hsuan Lee, Chien-Hsiang Huang, Kuan-Hsin Chen, Chun-Chieh Chin | 2023-10-10 |
| 11037289 | Method and system for scanning wafer | Pei-Hsuan Lee, Chien-Hsiang Huang, Kuan-Hsin Chen, Chun-Chieh Chin | 2021-06-15 |
| 10872406 | Hot spot defect detecting method and hot spot defect detecting system | Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen +6 more | 2020-12-22 |
| 6425202 | Microbe-mediated method and apparatus for attracting mosquitoes | Hao-Jan Lin, Yi-Hung Lin | 2002-07-30 |