Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9406833 | Neutron-detecting apparatuses and methods of fabrication | Rajendra P. Dahal, James J. Q. Lu, Yaron Danon, Ishwara B. Bhat | 2016-08-02 |
| 9151853 | Neutron-detecting apparatuses and methods of fabrication | Rajendra P. Dahal, James J. Q. Lu, Yaron Danon, Ishwara B. Bhat | 2015-10-06 |
| 8027529 | System for improving critical dimension uniformity | Shinn-Sheng Yu, Chih-Ming Ke, Chun-Kuang Chen, Tsai-Sheng Gau | 2011-09-27 |
| 7787685 | Extracting ordinary and extraordinary optical characteristics for critical dimension measurement of anisotropic materials | Chin-Ming Ke, Tsai-Sheng Gau | 2010-08-31 |
| 7777884 | Method and system for optimizing sub-nanometer critical dimension using pitch offset | Chih-Ming Ke, Shinn-Sheng Yu, Yu-Hsi Wang, Tsai-Sheng Gau, Kuo-Chen Huang | 2010-08-17 |
| 7732109 | Method and system for improving critical dimension uniformity | Shinn-Sheng Yu, Chih-Ming Ke, Chun-Kuang Chen, Tsai-Sheng Gau | 2010-06-08 |
| 7580129 | Method and system for improving accuracy of critical dimension metrology | Shinn-Sheng Yu, Chih-Ming Ke, Tsai-Sheng Gau | 2009-08-25 |
| 7349086 | Systems and methods for optical measurement | Joung-Wei Liou, Chih-Ming Ke, Szu-An Wu | 2008-03-25 |