Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7449911 | Method for determining electro-migration failure mode | Yi-Lung Cheng, Bi-Ling Liu, Chin-Chuang Peng, Chien Shih Tsai | 2008-11-11 |
| 7157367 | Device structure having enhanced surface adhesion and failure mode analysis | Yi-Lung Cheng, Chao-Hsiung Wang | 2007-01-02 |
| 6514673 | Rule to determine CMP polish time | Yu-Ku Lin, Wen-Pin Chang, Ying-Lang Wang | 2003-02-04 |
| 6291872 | Three-dimensional type inductor for mixed mode radio frequency device | Ying-Lang Wang, Jun Wu, Jowei Dun | 2001-09-18 |
| 6232043 | Rule to determine CMP polish time | Yu-Ku Lin, Wen-Pin Chang, Ying-Lang Wang | 2001-05-15 |