Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12293969 | Semiconductor structure and manufacturing method thereof | Chi-Ming Tsai | 2025-05-06 |
| 12254258 | Critical dimension uniformity | Chi-Ming Tsai | 2025-03-18 |
| 12174529 | Method for manufacturing semiconductor device | Wei-Chung Hu, Chi-Ming Tsai | 2024-12-24 |
| 12124163 | Mask defect prevention | Chih-Chiang Tu, Cheng-Ming Lin, Ching-Yueh Chen, Wei-Chung Hu, Ting-Chang Hsu +1 more | 2024-10-22 |
| 11900040 | Method and system for reducing layout distortion due to exposure non-uniformity | CHIA-HUI LIAO, Yihung Lin, Chi-Ming Tsai | 2024-02-13 |
| 11860530 | Mask defect prevention | Chih-Chiang Tu, Cheng-Ming Lin, Ching-Yueh Chen, Wei-Chung Hu, Ting-Chang Hsu +1 more | 2024-01-02 |
| 11763057 | Critical dimension uniformity | Chi-Ming Tsai | 2023-09-19 |
| 11476193 | Semiconductor structure and manufacturing method thereof | Chi-Ming Tsai | 2022-10-18 |
| 11429019 | Method for manufacturing semiconductor device | Wei-Chung Hu, Chi-Ming Tsai | 2022-08-30 |
| 11402743 | Mask defect prevention | Chih-Chiang Tu, Cheng-Ming Lin, Ching-Yueh Chen, Wei-Chung Hu, Ting-Chang Hsu +1 more | 2022-08-02 |
| 11308254 | Method and system for reducing layout distortion due to exposure non-uniformity | CHIA-HUI LIAO, Yihung Lin, Chi-Ming Tsai | 2022-04-19 |
| 11209728 | Mask and method for fabricating the same | Huang-Ming Wu, JIUN-HAO LIN, Jia-Guei Jou, Chi-Ming Tsai | 2021-12-28 |
| 11055464 | Critical dimension uniformity | Chi-Ming Tsai | 2021-07-06 |
| 10877380 | Using inverse lithography technology in a method of mask data preparation for generating integrated circuit | Yihung Lin, Yi-Feng Lu, Huang-Ming Wu | 2020-12-29 |
| 10866508 | Method for manufacturing photomask and semiconductor manufacturing method thereof | Wei-Chung Hu, Chi-Ming Tsai | 2020-12-15 |
| 10784196 | Semiconductor structure and manufacturing method thereof | Chi-Ming Tsai | 2020-09-22 |
| 9136092 | Structure and method for E-beam writing | Jia-Guei Jou, Yi-Hsien Chen, Peng Chen, Dong-Hsu Cheng | 2015-09-15 |
| 8650511 | Lithography performance check methods and apparatus | Peng Chen, Dong-Hsu Cheng, Chang-Jyh Hsieh | 2014-02-11 |
| 8458631 | Cycle time reduction in data preparation | Jia-Guei Jou, Peng Chen, Dong-Hsu Cheng | 2013-06-04 |