Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8826193 | Detection and removal of self-aligned double patterning artifacts | Yuelin Du, Gerard Luk-Pat, Benjamin D. Painter, James P. Shiely, Hua Song | 2014-09-02 |
| 8612899 | Fast lithography compliance check for place and route optimization | Gerard Lukpat | 2013-12-17 |
| 8347239 | Fast lithography compliance check for place and route optimization | Gerard Lukpat | 2013-01-01 |