Issued Patents All Time
Showing 26–35 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4860225 | Method and apparatus for storing measured data from sub-regions of a sputter crater which is generated and analyzed in a secondary ion mass spectrometer | Rolf Von Criegern, Johannes Fottner | 1989-08-22 |
| 4721855 | Method and apparatus for rapid measurements of electrical signals at circuit nodes of integrated circuits in which noise signals are also detected | — | 1988-01-26 |
| 4686466 | Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof | Hans-Peter Feuerbaum | 1987-08-11 |
| 4686455 | Method for the localization of time-critical events within a clock electronic circuit | Reiner Lassmann, Albert Krupp | 1987-08-11 |
| 4675602 | Method for automatically setting an operating point given signal curve measurements with a particle beam measuring apparatus | Hans-Peter Feuerbaum | 1987-06-23 |
| 4642566 | Method for the registration and representation of signals in the interior of integrated circuits by considering edge steepness and apparatus for implementing the method | — | 1987-02-10 |
| 4634972 | Method for measuring low-frequency signal progressions with an electron probe inside integrated circuits | — | 1987-01-06 |
| 4611119 | Method of emphasizing a subject area in a scanning microscope | Johann Otto | 1986-09-09 |
| 4477775 | Method and apparatus for a fast internal logic check of integrated circuits | — | 1984-10-16 |
| 4471302 | Method for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probe | Hans-Peter Feuerbaum, Ulrich Knauer, Johann Otto | 1984-09-11 |