Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4860225 | Method and apparatus for storing measured data from sub-regions of a sputter crater which is generated and analyzed in a secondary ion mass spectrometer | Peter Fazekas, Johannes Fottner | 1989-08-22 |
| 4851672 | Specimen mount for secondary ion mass spectrometry and other sensitive particle beam analysis methods and method for the operation thereof | Ingo Weitzel | 1989-07-25 |
| 4465935 | Electrically conductive sample support-mounting for secondary ion mass spectrometer analysis | Ingo Weitzel | 1984-08-14 |