Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4851672 | Specimen mount for secondary ion mass spectrometry and other sensitive particle beam analysis methods and method for the operation thereof | Rolf Von Criegern | 1989-07-25 |
| 4645929 | Method and apparatus for the compensation of charges in secondary ion mass spectrometry (SIMS) of specimens exhibiting poor electrical conductivity | Rolf V. Criegern | 1987-02-24 |
| 4465935 | Electrically conductive sample support-mounting for secondary ion mass spectrometer analysis | Rolf Von Criegern | 1984-08-14 |