Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188880 | Method of calibrating coordinate position identification accuracy of laser surface inspection apparatus and method of evaluating semiconductor wafer | Keiichiro Mori | 2025-01-07 |
| 12027428 | Semiconductor wafer evaluation method and manufacturing method and semiconductor wafer manufacturing process management method | Masahiro Murakami | 2024-07-02 |
| 11955390 | Semiconductor wafer evaluation method and semiconductor wafer manufacturing method | Yasuyuki Hashimoto, Hirotaka Kato | 2024-04-09 |
| 10261125 | Semiconductor wafer evaluation standard setting method, semiconductor wafer evaluation method, semiconductor wafer manufacturing process evaluation method, and semiconductor wafer manufacturing method | Keiichi Takanashi | 2019-04-16 |