Keiichiro Mori — 10 Patents at Sumco

Keiichiro Mori has been granted 10 US patents while listed as an inventor at Sumco. The first was granted in 1989 and the most recent in March 2025. Keiichiro Mori ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Keiichiro Mori in Saga, JP.

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #	Title	Co-Inventors	Date
12247927	Method of evaluating semiconductor wafer	Motoi Kurokami	2025-03-11
12188880	Method of calibrating coordinate position identification accuracy of laser surface inspection apparatus and method of evaluating semiconductor wafer	Takahiro NAGASAWA	2025-01-07
11948819	Method of evaluating silicon wafer, method of evaluating silicon wafer manufacturing process, method of manufacturing silicon wafer, and silicon wafer	—	2024-04-02
10895538	Method of preparing sample surface, method of analyzing sample surface, field-enhanced oxidation probe, and scanning probe microscope including field-enhanced oxidation probe	Kaori Hashimoto, Chie Hide	2021-01-19
10718720	Semiconductor wafer evaluation method and semiconductor wafer	—	2020-07-21
10422756	Semiconductor wafer evaluation method and semiconductor wafer	—	2019-09-24
9633913	Method of evaluating epitaxial wafer	—	2017-04-25
9553004	Cleaning method	Makoto Takemura	2017-01-24
8773669	Optical device	Hiroshi Kubota, Nobu Matsumoto, Mineharu Uchiyama, Hisao Kawasato	2014-07-08
4845972	Method for working the ends of steel pipe by upsetting and pressing	Eizo Takeuchi, Hisamitsu Miyoshi	1989-07-11

Keiichiro Mori — 10 Patents

Issued Patents All Time

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