Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12247927 | Method of evaluating semiconductor wafer | Motoi Kurokami | 2025-03-11 |
| 12188880 | Method of calibrating coordinate position identification accuracy of laser surface inspection apparatus and method of evaluating semiconductor wafer | Takahiro NAGASAWA | 2025-01-07 |
| 11948819 | Method of evaluating silicon wafer, method of evaluating silicon wafer manufacturing process, method of manufacturing silicon wafer, and silicon wafer | — | 2024-04-02 |
| 10895538 | Method of preparing sample surface, method of analyzing sample surface, field-enhanced oxidation probe, and scanning probe microscope including field-enhanced oxidation probe | Kaori Hashimoto, Chie Hide | 2021-01-19 |
| 10718720 | Semiconductor wafer evaluation method and semiconductor wafer | — | 2020-07-21 |
| 10422756 | Semiconductor wafer evaluation method and semiconductor wafer | — | 2019-09-24 |
| 9633913 | Method of evaluating epitaxial wafer | — | 2017-04-25 |
| 9553004 | Cleaning method | Makoto Takemura | 2017-01-24 |
| 8773669 | Optical device | Hiroshi Kubota, Nobu Matsumoto, Mineharu Uchiyama, Hisao Kawasato | 2014-07-08 |
| 4845972 | Method for working the ends of steel pipe by upsetting and pressing | Eizo Takeuchi, Hisamitsu Miyoshi | 1989-07-11 |