Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of preparing sample surface, method of analyzing sample surface, field-enhanced oxidation probe, and scanning probe microscope including field-enhanced oxidation probe

Method of preparing sample surface, method of analyzing sample surface, field-enhanced oxidation probe, and scanning probe microscope including field-enhanced oxidation probe

US Patent 10895538 · Granted Jan 19, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method of evaluating semiconductor wafer2025
Method of calibrating coordinate position identification accuracy of laser surfa2025
Method of evaluating silicon wafer, method of evaluating silicon wafer manufactu2024
Semiconductor wafer evaluation method and semiconductor wafer2020
Semiconductor wafer evaluation method and semiconductor wafer2019
Method of evaluating epitaxial wafer2017
Cleaning method2017
Optical device2014
Method for working the ends of steel pipe by upsetting and pressing1989