Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360161 | Scan circuit and method | Venkata Narayanan Srinivasan, Shiv Kumar Vats | 2025-07-15 |
| 11726140 | Scan circuit and method | Venkata Narayanan Srinivasan, Shiv Kumar Vats | 2023-08-15 |
| 11680982 | Automatic test pattern generation circuitry in multi power domain system on a chip | Venkata Narayanan Srinivasan, Manish Sharma | 2023-06-20 |
| 10151797 | Logic built-in self-test (LBIST) with pipeline scan enable launch on shift (LOS) flip-flop circuit | Venkata Narayanan Srinivasan | 2018-12-11 |
| 9222974 | System and method for reducing voltage drop during automatic testing of integrated circuits | V Srinivasan, Satinder Singh Malhi | 2015-12-29 |