Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366605 | Area, cost, and time-effective scan coverage improvement | Venkata Narayanan Srinivasan, Umesh Chandra Srivastava, Manish Sharma | 2025-07-22 |
| 12360161 | Scan circuit and method | Venkata Narayanan Srinivasan, Tripti Gupta | 2025-07-15 |
| 12345764 | Test pattern generation using multiple scan enables | Umesh Chandra Srivastava, Venkata Narayanan Srinivasan | 2025-07-01 |
| 11726140 | Scan circuit and method | Venkata Narayanan Srinivasan, Tripti Gupta | 2023-08-15 |
| 11714131 | Circuit and method for scan testing | Venkata Narayanan Srinivasan, Manish Sharma, Umesh Chandra Srivastava | 2023-08-01 |
| 10802077 | Test circuit for dynamic checking for faults on functional and BIST clock paths to memory in both ATPG and LBIST modes | Venkata Narayanan Srinivasan, Himanshu | 2020-10-13 |