Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366605 | Area, cost, and time-effective scan coverage improvement | Venkata Narayanan Srinivasan, Shiv Kumar Vats, Manish Sharma | 2025-07-22 |
| 12345764 | Test pattern generation using multiple scan enables | Shiv Kumar Vats, Venkata Narayanan Srinivasan | 2025-07-01 |
| 12146911 | TVF transition coverage with self-test and production-test time reduction | Venkata Narayanan Srinivasan, Manish Sharma, Jeena Mary George | 2024-11-19 |
| 11714131 | Circuit and method for scan testing | Venkata Narayanan Srinivasan, Manish Sharma, Shiv Kumar Vats | 2023-08-01 |