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Home › Logic built-in self-test (LBIST) with pipeline scan enable launch on shift (LOS) flip-flop circuit

Logic built-in self-test (LBIST) with pipeline scan enable launch on shift (LOS) flip-flop circuit

US Patent 10151797 · Granted Dec 11, 2018

Estimated economic value: $6,247,000 ⓘ

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