Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345659 | Method for measuring DIC defect shape on silicon wafer and polishing method | — | 2025-07-01 |
| 11119564 | Information processing apparatus, method for information processing, and game apparatus for performing different operations based on a movement of inputs | Yuuichi TANZAWA, Daisuke Miyata, Yoshimasa ASAO, Tetsuro Uchida | 2021-09-14 |
| 10831258 | Information processing apparatus, method for information processing, and game apparatus for performing different operations based on a movement of inputs | Yuuichi TANZAWA, Daisuke Miyata, Yoshimasa ASAO, Tetsuro Uchida | 2020-11-10 |
| 10513798 | Method for determining defect region | Hiroyasu Kikuchi | 2019-12-24 |
| 8902185 | Scrolling screen apparatus, method for scrolling screen, and game apparatus | Yuuichi TANZAWA, Daisuke Miyata, Yoshimasa ASAO, Tetsuro Uchida | 2014-12-02 |
| 8146581 | Method for slicing workpiece | Koji Kitagawa | 2012-04-03 |
| 7695347 | Method and pad for polishing wafer | Hisashi Masumura, Shigenao Ito, Kenichi Anzai, Kenichi Inoue | 2010-04-13 |
| 6884154 | Method for apparatus for polishing outer peripheral chamfered part of wafer | Kazutoshi Mizushima, Nakaji Miura, Yasuhiro Sekine, Makoto Suzuki | 2005-04-26 |