Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11953312 | System and method of object inspection using multispectral 3D laser scanning | Albert Archmawety, Jun Kang Ng, Chee Chye Lee | 2024-04-09 |
| 11825211 | Method of color inspection by using monochrome imaging with multiple wavelengths of light | Albert Archwamety, Jun Kang Ng, Chee Chye Lee | 2023-11-21 |
| 10876975 | System and method for inspecting a wafer | Ajharali Amanullah, Jing Lin, Han Cheng Ge | 2020-12-29 |
| 10161881 | System and method for inspecting a wafer | Ajharali Amanullah, Lin Jing, Han Cheng Ge | 2018-12-25 |
| 10151580 | Methods of inspecting a 3D object using 2D image processing | Albert Archwamety, Han Cheng Ge, Ruini Cao | 2018-12-11 |