Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876975 | System and method for inspecting a wafer | Jing Lin, Han Cheng Ge, Kok Weng Wong | 2020-12-29 |
| 10504761 | Method system for generating 3D composite images of objects and determining object properties based thereon | — | 2019-12-10 |
| 10161881 | System and method for inspecting a wafer | Lin Jing, Han Cheng Ge, Kok Weng Wong | 2018-12-25 |
| 9934565 | Systems and methods for automatically verifying correct die removal from film frames | Tim Hing Lai, Jing Lin, Lian Seng Ng, Soon Guan Tan | 2018-04-03 |
| 9863889 | System and method for inspecting a wafer | Han Cheng Ge | 2018-01-09 |
| 9816938 | Apparatus and method for selectively inspecting component sidewalls | — | 2017-11-14 |
| 9746426 | System and method for capturing illumination reflected in multiple directions | — | 2017-08-29 |
| 8885918 | System and method for inspecting a wafer | Albert Archwamety, Hongtu Guo | 2014-11-11 |
| 8401272 | Patterned wafer defect inspection system and method | Lin Jing, Chunlin Luke Zeng | 2013-03-19 |
| 7869021 | Multiple surface inspection system and method | Han Cheng Ge, Huek Choy Tan, Hing Tim Lai | 2011-01-11 |
| 7768633 | Multiple surface inspection system and method | Han Cheng Ge, Huek Choy Tan, Hing Tim Lai | 2010-08-03 |