Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10876975 | System and method for inspecting a wafer | Ajharali Amanullah, Jing Lin, Kok Weng Wong | 2020-12-29 |
| 10161881 | System and method for inspecting a wafer | Ajharali Amanullah, Lin Jing, Kok Weng Wong | 2018-12-25 |
| 10151580 | Methods of inspecting a 3D object using 2D image processing | Kok Weng Wong, Albert Archwamety, Ruini Cao | 2018-12-11 |
| 9863889 | System and method for inspecting a wafer | Ajharali Amanullah | 2018-01-09 |
| 7869021 | Multiple surface inspection system and method | Ajharali Amanullah, Huek Choy Tan, Hing Tim Lai | 2011-01-11 |
| 7768633 | Multiple surface inspection system and method | Ajharali Amanullah, Huek Choy Tan, Hing Tim Lai | 2010-08-03 |