Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11825211 | Method of color inspection by using monochrome imaging with multiple wavelengths of light | Kok Weng Wong, Jun Kang Ng, Chee Chye Lee | 2023-11-21 |
| 10151580 | Methods of inspecting a 3D object using 2D image processing | Kok Weng Wong, Han Cheng Ge, Ruini Cao | 2018-12-11 |
| 8885918 | System and method for inspecting a wafer | Ajharali Amanullah, Hongtu Guo | 2014-11-11 |