Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9105546 | Imaging systems with backside illuminated near infrared imaging pixels | Gennadiy Agranov | 2015-08-11 |
| 8878264 | Global shutter pixel with improved efficiency | Jingyi Bai | 2014-11-04 |
| 7833819 | Method and apparatus for decreasing storage node parasitic charge in active pixel image sensors | Hong-Wei Lee | 2010-11-16 |
| 7619184 | Multi-parameter process and control method | Jeffrey Nelson, Roger Eagans | 2009-11-17 |
| 7383147 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Robert Blunn | 2008-06-03 |
| 7337088 | Intelligent measurement modular semiconductor parametric test system | Michael Dorough, Robert Blunn | 2008-02-26 |
| 7165004 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Robert Blunn | 2007-01-16 |
| 7162386 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Robert Blunn | 2007-01-09 |
| 7139672 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Robert Blunn | 2006-11-21 |
| 7010451 | Dynamic creation and modification of wafer test maps during wafer testing | Michael Dorough, Robert M. Gravelle | 2006-03-07 |
| 5847276 | Fluid displacement level, density and concentration measurement system | Victor Mimken, Tom Krawzak | 1998-12-08 |
| 5744716 | Fluid displacement level, density and concentration measurement system | Victor Mimken, Tom Krawzak | 1998-04-28 |