Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7383147 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Sergey Velichko | 2008-06-03 |
| 7337088 | Intelligent measurement modular semiconductor parametric test system | Sergey Velichko, Michael Dorough | 2008-02-26 |
| 7165004 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Sergey Velichko | 2007-01-16 |
| 7162386 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Sergey Velichko | 2007-01-09 |
| 7139672 | Dynamically adaptable semiconductor parametric testing | Michael Dorough, Sergey Velichko | 2006-11-21 |