Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7383147 | Dynamically adaptable semiconductor parametric testing | Robert Blunn, Sergey Velichko | 2008-06-03 |
| 7337088 | Intelligent measurement modular semiconductor parametric test system | Sergey Velichko, Robert Blunn | 2008-02-26 |
| 7165004 | Dynamically adaptable semiconductor parametric testing | Robert Blunn, Sergey Velichko | 2007-01-16 |
| 7162386 | Dynamically adaptable semiconductor parametric testing | Robert Blunn, Sergey Velichko | 2007-01-09 |
| 7139672 | Dynamically adaptable semiconductor parametric testing | Robert Blunn, Sergey Velichko | 2006-11-21 |
| 7010451 | Dynamic creation and modification of wafer test maps during wafer testing | Robert M. Gravelle, Sergey Velichko | 2006-03-07 |
| 6859760 | Remote semiconductor microscopy | — | 2005-02-22 |
| 6567770 | Remote semiconductor microscopy | — | 2003-05-20 |
| 6370487 | Remote semiconductor microscopy | — | 2002-04-09 |