Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10198827 | Inspection method and system and a method of inspecting a semiconductor device using the same | Sangkyo Lim, Sunhee Shim, MiJung Jeon | 2019-02-05 |
| 9360308 | Methods for measuring a thickness of an object | Byung Hyun Hwang, Kwang Hoon Kim, Chulgi Song, Choonshik Leem | 2016-06-07 |