Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10198827 | Inspection method and system and a method of inspecting a semiconductor device using the same | Woongkyu Son, Sangkyo Lim, MiJung Jeon | 2019-02-05 |
SS
Sunhee Shim
Overall (All Time): #2,841,476 of 4,157,543Top 70%
1
Patents All Time