Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11183363 | Scanning electron microscope apparatus and operation method thereof | Yongmin Cho, TaeYong Lee | 2021-11-23 |
| 10198827 | Inspection method and system and a method of inspecting a semiconductor device using the same | Woongkyu Son, Sunhee Shim, MiJung Jeon | 2019-02-05 |