Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12327579 | Inspection device | Ingi Kim, Harutaka Sekiya, Tomoki Onishi | 2025-06-10 |
| 12051604 | Apparatus for manufacturing semiconductor device and method of manufacturing semiconductor device | Daisuke NAGATOMO, Fumitaka MOROISHI, Masanori Izumita, Takahiro Tokumiya, Takamasa Sugiura +2 more | 2024-07-30 |
| 11796608 | Magnetic property measurement apparatus | Harutaka Sekiya, Tomoki Onishi | 2023-10-24 |
| 10847369 | Wafer bonding method, method for manufacturing semiconductor device, and apparatus therefor | Fumitaka MOROISHI, Masato KAJINAMI | 2020-11-24 |
| 10444162 | Method of testing an object and apparatus for performing the same | Masato KAJINAMI, Tatsuya Ishimoto | 2019-10-15 |
| 9726204 | Fluid pressure actuator | Masato KAJINAMI, Fumitaka MOROISHI, Keiji Murata, Tatsuya Ishimoto, Yoshiaki Yukimori | 2017-08-08 |
| 9082885 | Semiconductor chip bonding apparatus and method of forming semiconductor device using the same | Yoshiaki Yukimori, Masato KAJINAMI | 2015-07-14 |
| 7492942 | Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus | Akio Ishikawa | 2009-02-17 |