JH

Jeongnam Han

Samsung: 11 patents #12,136 of 75,807Top 20%
📍 Seoul, KR: #5,298 of 39,741 inventorsTop 15%
Overall (All Time): #458,024 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
10128336 Semiconductor devices and methods for manufacturing the same Sangjine Park, Boun Yoon 2018-11-13
9966432 Semiconductor devices including an etch stop pattern and a sacrificial pattern with coplanar upper surfaces and a gate and a gap fill pattern with coplanar upper surfaces Sangjine Park, Boun Yoon 2018-05-08
9859432 Semiconductor devices having spacer protection pattern Yongsun Ko, Sangjine Park, Hagju Cho, Byungjae PARK 2018-01-02
9716162 Semiconductor device and method of fabricating the same Sangjine Park, Jae-Jik Baek, Myunggeun Song, Boun Yoon, Sukhun Choi 2017-07-25
9117692 Semiconductor device having dual metal silicide layers and method of manufacturing the same Sangjine Park, Boun Yoon, Kee-Sang Kwon, Byung-Kwon Cho, Wonsang Choi 2015-08-25
8901663 Semiconductor devices having passive element in recessed portion of device isolation pattern and methods of fabricating the same Sukhun Choi, Boun Yoon, Injoon Yeo 2014-12-02
8889552 Semiconductor device having dual metal silicide layers and method of manufacturing the same Sangline Park, Boun Yoon, Kee-Sang Kwon, Byung-Kwon Cho, Wongsang Choi 2014-11-18
8859371 Method for manufacturing semiconductor device having dual gate dielectric layer Myung Geun Song, Ki-Hyung Ko, Hayoung JEON, Boun Yoon 2014-10-14
8841769 Semiconductor device having metal plug and method of manufacturing the same Sangjine Park, Boun Yoon, Kee-Sang Kwon, Wonsang Choi 2014-09-23
8790988 Semiconductor devices having passive element in recessed portion of device isolation pattern and methods of fabricating the same Sukhun Choi, Boun Yoon, Injoon Yeo 2014-07-29
8228089 Wafer test method and wafer test apparatus Youngok Kim, Changki Hong, Boun Yoon, Kuntack Lee, Young-Hoo Kim 2012-07-24