Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7339663 | Method and apparatus for classifying repetitive defects on a substrate | Young-Kyu Lim, Byung-Am Lee, Byung-Seol Ahn, Chang-Hoon Lee, Jung-Lan Lee +1 more | 2008-03-04 |
| 7155366 | Apparatus and method for inspecting patterns on wafers | Chang-Hoon Lee, Byung-Am Lee, Byung-Seol Ahn, Joo-Woo Kim, Sung-Man Lee | 2006-12-26 |