Issued Patents All Time
Showing 76–98 of 98 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7349246 | Initial firing method and phase change memory device for performing firing effectively | Beak-Hyung Cho, Choong-Keun Kwak | 2008-03-25 |
| 7317655 | Memory cell array biasing method and a semiconductor memory device | Beak-Hyung Cho, Choong-Keun Kwak, Sang-Beom Kang, Woo-Yeong Cho, Hyung-Rok Oh | 2008-01-08 |
| 7304885 | Phase change memories and/or methods of programming phase change memories using sequential reset control | Beak-Hyung Cho, Woo-Yeong Cho | 2007-12-04 |
| 7283387 | Phase change random access memory device having variable drive voltage circuit | Woo-Yeong Cho, Kwang-Jin Lee, Choong-Keun Kwak | 2007-10-16 |
| 7274586 | Method for programming phase-change memory array to set state and circuit of a phase-change memory device | Byung-Gil Choi, Choong-Keun Kwak, Beak-Hyung Cho | 2007-09-25 |
| 7254055 | Initial firing method and phase change memory device for performing firing effectively | Beak-Hyung Cho, Choong-Keun Kwak | 2007-08-07 |
| 7227776 | Phase change random access memory (PRAM) device | Beak-Hyung Cho, Byung-Gil Choi, Choong-Keun Kwak | 2007-06-05 |
| 7215592 | Memory device with reduced word line resistance | Beak-Hyung Cho | 2007-05-08 |
| 7110286 | Phase-change memory device and method of writing a phase-change memory device | Byung-Gil Choi, Choong-Keun Kwak, Beak-Hyung Cho | 2006-09-19 |
| 7075848 | Redundancy circuit in semiconductor memory device having a multiblock structure | Byung-Gil Choi, Choong-Keun Kwak | 2006-07-11 |
| 7064601 | Reference voltage generating circuit using active resistance device | Choong-Keun Kwak, Woo-Yeong Cho | 2006-06-20 |
| 7005748 | Flip chip interface circuit of a semiconductor memory device | Beak-Hyung Cho | 2006-02-28 |
| 6943395 | Phase random access memory with high density | Hyung-Rok Oh, Beak-Hyung Cho, Woo-Yeong Cho | 2005-09-13 |
| 6816429 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Choong-Keun Kwak, Yun-seung Shin | 2004-11-09 |
| 6490223 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Choong-Keun Kwak, Yun-seung Shin | 2002-12-03 |
| 6459642 | Semiconductor memory device | Beak-Hyung Cho, Jong-Pil Son | 2002-10-01 |
| 6456547 | Semiconductor memory device with function of repairing stand-by current failure | Hyun-Sun Mo, Choong-Keun Kwak | 2002-09-24 |
| 6288926 | Static semiconductor memory device and fabricating method thereof | Byung-Gil Choi, Sang-Jib Han, Choong-Keun Kwak, Soon-Moon Jung, Sung-Bong Kim | 2001-09-11 |
| 6026039 | Parallel test circuit for semiconductor memory | Choong-Keun Kwak, Yun-seung Shin | 2000-02-15 |
| 5959907 | Semiconductor memory device having a redundancy circuit | Choong-Keun Kwak | 1999-09-28 |
| 5936875 | Integrated circuit memory devices including overlapping power lines and bit lines | Dae-Yong Kim, Young-Ho Suh, Choung-Keun Kwak | 1999-08-10 |
| 5754487 | Bit line precharge circuit | Choong-Keun Kwak, Young-Ho Suh, Hyun-Geun Byun | 1998-05-19 |
| 5487050 | Decoding circuit and method for a semiconductor memory device | Kyeong-rae Kim, Seung-Kweon Yang, Hee-Choul Park | 1996-01-23 |