YS

Yun-seung Shin

Samsung: 33 patents #3,563 of 75,807Top 5%
📍 Seoul, KR: #1,515 of 39,741 inventorsTop 4%
Overall (All Time): #108,751 of 4,157,543Top 3%
33
Patents All Time

Issued Patents All Time

Showing 1–25 of 33 patents

Patent #TitleCo-InventorsDate
8284129 Light emitting pixel and apparatus for driving the same Jong Hak Baek 2012-10-09
8043869 Magnetic memory device and method of fabricating the same Woo-Yeong Cho, Hyun-Geun Byun, Choong-Keun Kwak 2011-10-25
7994493 Phase change memory devices employing cell diodes and methods of fabricating the same Woo-Yeong Cho, Du-Eung Kim, Hyun-Geun Byun, Sang-Beom Kang, Beak-Hyung Cho +1 more 2011-08-09
7973483 Light emitting pixel and apparatus for driving the same Jong Hak Baek 2011-07-05
7952918 Method of operating a magnetoresistive RAM Woo-Yeong Cho 2011-05-31
7851878 Magnetic memory device and method of fabricating the same Woo-Yeong Cho, Hyun-Geun Byun, Choong-Keun Kwak 2010-12-14
7791929 Magnetoresistive RAM and associated methods Woo-Yeong Cho 2010-09-07
7652926 Nonvolatile semiconductor memory device including a cell string with dummy cells Sang-Gu Kang 2010-01-26
7605473 Nonvolatile memory devices Jung-Dal Choi, Jong-Sun Sel 2009-10-20
7595747 Digital-to-analog converter, and method thereof Ji-Woon Jung, Myung Hee Lee 2009-09-29
7582941 Magnetic memory device and method of fabricating the same Woo-Yeong Cho, Hyun-Geun Byun, Choong-Keun Kwak 2009-09-01
7573411 Digital-to-analog converter, display panel driver having the same, and digital-to-analog converting method Ju-Hyun Ko 2009-08-11
7427531 Phase change memory devices employing cell diodes and methods of fabricating the same Woo-Yeong Cho, Du-Eung Kim, Hyun-Geun Byun, Sang-Beom Kang, Beak-Hyung Cho +1 more 2008-09-23
6816429 Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same Sang-Jib Han, Du-Eung Kim, Choong-Keun Kwak 2004-11-09
6490223 Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same Sang-Jib Han, Du-Eung Kim, Choong-Keun Kwak 2002-12-03
6487117 Method for programming NAND-type flash memory device using bulk bias Jeong-Hyuk Choi 2002-11-26
6026039 Parallel test circuit for semiconductor memory Du-Eung Kim, Choong-Keun Kwak 2000-02-15
5965939 Semiconductor device and a method of manufacture Kyeong Tae Kim, Young Hun Park, Won-Mo Park, Ji-hong Ahn 1999-10-12
5960293 Methods including oxide masks for fabricating capacitor structures for integrated circuit devices Weon-cheol Hong 1999-09-28
5940716 Methods of forming trench isolation regions using repatterned trench masks Joo Jin 1999-08-17
5930621 Methods for forming vertical electrode structures and related structures Dug-dong Kang 1999-07-27
5902126 Methods for forming integrated circuit capacitor electrodes including surrounding insulating sidewalls and spacers Sun-cheol Hong 1999-05-11
5879984 Methods for fabricating capacitor structures using a photoresist layer Jong Jin Lee 1999-03-09
5858860 Methods of fabricating field isolated semiconductor devices including step reducing regions Myoung-seob Shim, Won-Taek Choi 1999-01-12
5852572 Small-sized static random access memory cell Soon-Moon Jung 1998-12-22