Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8039274 | Multi-chip package semiconductor device and method of detecting a failure thereof | — | 2011-10-18 |
| 7663217 | Semiconductor device package | Byung Jo Kim, Hyung-Lae Eun | 2010-02-16 |
| 7541612 | Multi-chip package semiconductor device and method of detecting a failure thereof | — | 2009-06-02 |
| 7486532 | Semiconductor multi-chip package including two semiconductor memory chips having different memory densities | Jai-kyeong Shinn | 2009-02-03 |
| 7154790 | Multi-chip semiconductor packages and methods of operating the same | Chang Hwan Lee | 2006-12-26 |
| 6816429 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Du-Eung Kim, Choong-Keun Kwak, Yun-seung Shin | 2004-11-09 |
| 6510094 | Method and apparatus for refreshing semiconductor memory | Min-Chul Chung, Chang-Rae Kim, Jong Yul Park | 2003-01-21 |
| 6490223 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Du-Eung Kim, Choong-Keun Kwak, Yun-seung Shin | 2002-12-03 |
| 6463002 | Refresh-type memory with zero write recovery time and no maximum cycle time | Chang-Rae Kim, Jong Yul Park, Min-Chul Chung | 2002-10-08 |
| 6288926 | Static semiconductor memory device and fabricating method thereof | Du-Eung Kim, Byung-Gil Choi, Choong-Keun Kwak, Soon-Moon Jung, Sung-Bong Kim | 2001-09-11 |
| 6275437 | Refresh-type memory with zero write recovery time and no maximum cycle time | Chang-Rae Kim, Jong Yul Park, Min-Chul Chung | 2001-08-14 |
| 6271705 | Data output circuits having enhanced ESD resistance and related methods | Young-Ho Suh, Choong-Keun Kwak | 2001-08-07 |
| 6256254 | Semiconductor memory device decoder | Choong-Keun Kwak | 2001-07-03 |
| 5994943 | Data output circuits having enhanced ESD resistance and related methods | Young-Ho Suh, Choong-Keun Kwak | 1999-11-30 |