| 9464992 |
Automated wafer defect inspection system and a process of performing such inspection |
Jeffrey O'Dell, Thomas Verburgt, Cory Watkins |
2016-10-11 |
| 9337071 |
Automated wafer defect inspection system and a process of performing such inspection |
Jeffrey O'Dell, Thomas Verburgt, Cory Watkins |
2016-05-10 |
| 8130372 |
Wafer holding mechanism |
Cory Watkins, Pat Simpkins, Kevin Barr |
2012-03-06 |
| 7822260 |
Edge inspection |
Cory Watkins, Francy Abraham |
2010-10-26 |
| 7729528 |
Automated wafer defect inspection system and a process of performing such inspection |
Jeffrey O'Dell, Thomas Verburgt, Cory Watkins |
2010-06-01 |
| 7703823 |
Wafer holding mechanism |
Cory Watkins, Pat Simpkins, Kevin Barr |
2010-04-27 |
| 7629993 |
Automated wafer defect inspection system using backside illumination |
Jeremy Jenum, Willard Charles Raymond |
2009-12-08 |
| 7340087 |
Edge inspection |
Cory Watkins, Francy Abraham |
2008-03-04 |
| 7321108 |
Dynamic focusing method and apparatus |
Cory Watkins, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more |
2008-01-22 |
| 7196300 |
Dynamic focusing method and apparatus |
Cory Watkins, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more |
2007-03-27 |
| 7170075 |
Inspection tool with a 3D point sensor to develop a focus map |
Norman L. Oberski |
2007-01-30 |
| 7111095 |
Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual lane |
Cory Watkins |
2006-09-19 |
| 6937753 |
Automated wafer defect inspection system and a process of performing such inspection |
Jeffrey O'Dell, Thomas Verburgt, Steve Herrmann |
2005-08-30 |
| 6826298 |
Automated wafer defect inspection system and a process of performing such inspection |
Jeffrey O'Dell, Thomas Verburgt, Cory Watkins |
2004-11-30 |
| 6324298 |
Automated wafer defect inspection system and a process of performing such inspection |
Jeffrey O'Dell, Thomas Verburgt |
2001-11-27 |