Mark Harless — 15 Patents at Rudolph Technologies

Mark Harless has been granted 15 US patents while listed as an inventor at Rudolph Technologies. The first was granted in 2001 and the most recent in October 2016. Mark Harless ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Mark Harless in New Hope, MN, US.

Patents per Year

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
9464992	Automated wafer defect inspection system and a process of performing such inspection	Jeffrey O'Dell, Thomas Verburgt, Cory Watkins	2016-10-11	$3,600,000
9337071	Automated wafer defect inspection system and a process of performing such inspection	Jeffrey O'Dell, Thomas Verburgt, Cory Watkins	2016-05-10	$3,608,000
8130372	Wafer holding mechanism	Cory Watkins, Pat Simpkins, Kevin Barr	2012-03-06	$2,926,000
7822260	Edge inspection	Cory Watkins, Francy Abraham	2010-10-26	$3,044,000
7729528	Automated wafer defect inspection system and a process of performing such inspection	Jeffrey O'Dell, Thomas Verburgt, Cory Watkins	2010-06-01	$4,340,000
7703823	Wafer holding mechanism	Cory Watkins, Pat Simpkins, Kevin Barr	2010-04-27	$1,719,000
7629993	Automated wafer defect inspection system using backside illumination	Jeremy Jenum, Willard Charles Raymond	2009-12-08	$4,180,000
7340087	Edge inspection	Cory Watkins, Francy Abraham	2008-03-04	$2,972,000
7321108	Dynamic focusing method and apparatus	Cory Watkins, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more	2008-01-22
7196300	Dynamic focusing method and apparatus	Cory Watkins, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more	2007-03-27	$2,733,000
7170075	Inspection tool with a 3D point sensor to develop a focus map	Norman L. Oberski	2007-01-30	$4,909,000
7111095	Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual lane	Cory Watkins	2006-09-19
6937753	Automated wafer defect inspection system and a process of performing such inspection	Jeffrey O'Dell, Thomas Verburgt, Steve Herrmann	2005-08-30	$2,847,000
6826298	Automated wafer defect inspection system and a process of performing such inspection	Jeffrey O'Dell, Thomas Verburgt, Cory Watkins	2004-11-30	$2,304,000
6324298	Automated wafer defect inspection system and a process of performing such inspection	Jeffrey O'Dell, Thomas Verburgt	2001-11-27	$1,760,000

Mark Harless — 15 Patents

Patents per Year

Issued Patents All Time

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