Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9464992 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Cory Watkins | 2016-10-11 |
| 9337071 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Cory Watkins | 2016-05-10 |
| 8130372 | Wafer holding mechanism | Cory Watkins, Pat Simpkins, Kevin Barr | 2012-03-06 |
| 7822260 | Edge inspection | Cory Watkins, Francy Abraham | 2010-10-26 |
| 7729528 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Cory Watkins | 2010-06-01 |
| 7703823 | Wafer holding mechanism | Cory Watkins, Pat Simpkins, Kevin Barr | 2010-04-27 |
| 7629993 | Automated wafer defect inspection system using backside illumination | Jeremy Jenum, Willard Charles Raymond | 2009-12-08 |
| 7340087 | Edge inspection | Cory Watkins, Francy Abraham | 2008-03-04 |
| 7321108 | Dynamic focusing method and apparatus | Cory Watkins, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more | 2008-01-22 |
| 7196300 | Dynamic focusing method and apparatus | Cory Watkins, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more | 2007-03-27 |
| 7170075 | Inspection tool with a 3D point sensor to develop a focus map | Norman L. Oberski | 2007-01-30 |
| 7111095 | Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual lane | Cory Watkins | 2006-09-19 |
| 6937753 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Steve Herrmann | 2005-08-30 |
| 6826298 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt, Cory Watkins | 2004-11-30 |
| 6324298 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Thomas Verburgt | 2001-11-27 |