JJ

Jeremy Jenum

RT Rudolph Technologies: 1 patents #70 of 136Top 55%
Overall (All Time): #3,342,914 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7629993 Automated wafer defect inspection system using backside illumination Mark Harless, Willard Charles Raymond 2009-12-08