CW

Cory Watkins

RT Rudolph Technologies: 10 patents #2 of 136Top 2%
AT August Technology: 8 patents #1 of 19Top 6%
Overall (All Time): #239,459 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9464992 Automated wafer defect inspection system and a process of performing such inspection Jeffrey O'Dell, Thomas Verburgt, Mark Harless 2016-10-11
9337071 Automated wafer defect inspection system and a process of performing such inspection Jeffrey O'Dell, Thomas Verburgt, Mark Harless 2016-05-10
8130372 Wafer holding mechanism Mark Harless, Pat Simpkins, Kevin Barr 2012-03-06
8045788 Product setup sharing for multiple inspection systems Patrick Simpkins 2011-10-25
7822260 Edge inspection Mark Harless, Francy Abraham 2010-10-26
7813638 System for generating camera triggers David G. Bocek 2010-10-12
7729528 Automated wafer defect inspection system and a process of performing such inspection Jeffrey O'Dell, Thomas Verburgt, Mark Harless 2010-06-01
7703823 Wafer holding mechanism Mark Harless, Pat Simpkins, Kevin Barr 2010-04-27
7589783 Camera and illumination matching for inspection system Patrick Simpkins 2009-09-15
7340087 Edge inspection Mark Harless, Francy Abraham 2008-03-04
7321108 Dynamic focusing method and apparatus Mark Harless, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more 2008-01-22
7196300 Dynamic focusing method and apparatus Mark Harless, David Vaughnn, Pat Simpkins, Shaileshkumar Goyal, Gerald Brown +1 more 2007-03-27
7111095 Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual lane Mark Harless 2006-09-19
6970287 Confocal 3D inspection system and process David Vaughn 2005-11-29
6882415 Confocal 3D inspection system and process David Vaughn 2005-04-19
6870609 Confocal 3D inspection system and process David Vaughnn 2005-03-22
6826298 Automated wafer defect inspection system and a process of performing such inspection Jeffrey O'Dell, Thomas Verburgt, Mark Harless 2004-11-30
6773935 Confocal 3D inspection system and process David Vaughnn, Alan Blair 2004-08-10
6731383 Confocal 3D inspection system and process Alan Blair 2004-05-04