Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8278964 | Method and apparatus for test and characterization of semiconductor components | Frederick A. Ware, Scott C. Best, Richard Perego, Ely Tsern, Jeff Mitchell | 2012-10-02 |
| 7592824 | Method and apparatus for test and characterization of semiconductor components | Frederick A. Ware, Scott C. Best, Richard Perego, Ely Tsern, Jeff Mitchell | 2009-09-22 |
| 7331006 | Multiple sweep point testing of circuit devices | Donald C. Stark | 2008-02-12 |
| 7162672 | Multilevel signal interface testing with binary test apparatus by emulation of multilevel signals | Carl W. Werner, Jared L. Zerbe, William Stonecypher, Haw-Jyh Liaw | 2007-01-09 |
| 6975956 | Multiple sweep point testing of circuit devices | Donald C. Stark | 2005-12-13 |