Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8278964 | Method and apparatus for test and characterization of semiconductor components | Frederick A. Ware, Scott C. Best, Timothy Chang, Ely Tsern, Jeff Mitchell | 2012-10-02 |
| 7592824 | Method and apparatus for test and characterization of semiconductor components | Frederick A. Ware, Scott C. Best, Timothy Chang, Ely Tsern, Jeff Mitchell | 2009-09-22 |