| 9111645 |
Request-command encoding for reduced-data-rate testing |
Kishore Ven Kasamsetty, Wayne S. Richardson, Frederick A. Ware |
2015-08-18 |
| 7755968 |
Integrated circuit memory device having dynamic memory bank count and page size |
Steven C. Woo, Michael Ching, Chad A. Bellows, Wayne S. Richardson, Jun Kim |
2010-07-13 |
| 7274244 |
Pulse multiplexed output system |
Wayne Fang, Wayne S. Richardson |
2007-09-25 |
| 7254075 |
Integrated circuit memory system having dynamic memory bank count and page size |
Steven C. Woo, Michael Ching, Chad A. Bellows, Wayne S. Richardson, Jun Kim |
2007-08-07 |
| 7091761 |
Impedance controlled output driver |
Donald C. Stark, Jun Kim, Michael Ching, Natsuki Kushiyama |
2006-08-15 |
| 6922092 |
Impedance controlled output driver |
Donald C. Stark, Jun Kim, Michael Ching, Natsuki Kushiyama |
2005-07-26 |
| 6754120 |
DRAM output circuitry supporting sequential data capture to reduce core access times |
Chad A. Bellows, Wayne S. Richardson, Lawrence Lai |
2004-06-22 |
| 6661268 |
Charge compensation control circuit and method for use with output driver |
Donald C. Stark, Jun Kim, Michael Ching, Natsuki Kushiyama |
2003-12-09 |
| 6342800 |
Charge compensation control circuit and method for use with output driver |
Donald C. Stark, Jun Kim, Michael Ching, Natsuki Kushiyama |
2002-01-29 |
| 6295242 |
SRAM with current-mode test read data path |
Lee-Lean Shu, Katsunori Seno |
2001-09-25 |
| 6163178 |
Impedance controlled output driver |
Donald C. Stark, Jun Kim, Michael Ching, Natsuki Kushiyama |
2000-12-19 |
| 5519712 |
Current mode test circuit for SRAM |
Lee-Lean Shu, Katsunori Seno |
1996-05-21 |
| 5457407 |
Binary weighted reference circuit for a variable impedance output buffer |
Lee-Lean Shu |
1995-10-10 |
| 5384503 |
SRAM with current-mode read data path |
Lee-Lean Shu, Katsunori Seno |
1995-01-24 |
| 5327382 |
Method of testing redundant memory cells |
Katsunori Seno |
1994-07-05 |