| 11626407 |
DRAM with selective epitaxial cell transistor |
Andrew J. Walker, Dafna Beery, Amitay Levi |
2023-04-11 |
| 11545524 |
Selector transistor with continuously variable current drive |
Andrew J. Walker, Dafna Beery, Amitay Levi |
2023-01-03 |
| 11444123 |
Selector transistor with metal replacement gate wordline |
Dafna Beery, Amitay Levi, Andrew J. Walker |
2022-09-13 |
| 11329048 |
DRAM with selective epitaxial transistor and buried bitline |
Andrew J. Walker, Dafna Beery, Amitay Levi |
2022-05-10 |
| 11302697 |
DRAM with selective epitaxial cell transistor |
Andrew J. Walker, Dafna Beery, Amitay Levi |
2022-04-12 |
| 10236075 |
Predicting tunnel barrier endurance using redundant memory structures |
Kuk-Hwan Kim, Benjamin Louie, Amitay Levi |
2019-03-19 |
| 7812589 |
Modified current source (MCS) with seamless range switching |
James Borthwick, Tal Raichman |
2010-10-12 |
| 7405573 |
Electrical connector for semiconductor device test fixture and test assembly |
— |
2008-07-29 |
| 7172450 |
High temperature open ended zero insertion force (ZIF) test socket |
Robert J. Sylvia, Adalberto M. Ramirez, Jens Ullmann, Jose Ysaguirre, Maurice C. Evans |
2007-02-06 |
| 7151389 |
Dual channel source measurement unit for semiconductor device testing |
Tal Raichman, James Borthwick, Michael A. Casolo |
2006-12-19 |
| 7098648 |
Automatic range finder for electric current testing |
Gedaliahoo Krieger, James Borthwick |
2006-08-29 |
| 7049713 |
Pulsed current generator circuit with charge booster |
Gedaliahoo Krieger, Maurice C. Evans, Jens Ullmann |
2006-05-23 |
| 6798228 |
Test socket for packaged semiconductor devices |
— |
2004-09-28 |
| 6592389 |
High-temperature minimal (zero) insertion force socket |
— |
2003-07-15 |
| 6565373 |
ZIF socket and actuator for DIP |
— |
2003-05-20 |
| 6469494 |
Programmable connector |
— |
2002-10-22 |
| 6150829 |
Three-dimensional programmable connector |
— |
2000-11-21 |
| 4845381 |
Voltage level shifting circuit |
— |
1989-07-04 |