TK

Tauseef Kazi

QU Qualcomm: 13 patents #1,634 of 12,104Top 15%
Overall (All Time): #306,409 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12305378 Water soluble tool for clearing blockage in a toilet 2025-05-20
12266247 System for detecting and alerting intrusion into a protected area with a mechanism to decipher between authorized and unauthorized access Imran Khalid, Khalid Mahmood 2025-04-01
12250454 Camera dynamic voting to optimize fast sensor mode power Aravind Bhaskara, Zhurang Zhao, Rohan Desai, Michael TIPTON, Joshua H. Stubbs +2 more 2025-03-11
12154278 Scale image resolution for motion estimation Nitin Bandwar, Pia Zobel, Roee Hardoon, Sungwon Lee, Bing Han 2024-11-26
11277562 Image stabilization using machine learning Young Hoon Kang, Hee Jun Park, Ron Gaizman, Eran Pinhasov, Meir Tzur 2022-03-15
10771698 Image stabilization using machine learning Young Hoon Kang, Hee Jun Park, Ron Gaizman, Eran Pinhasov, Meir Tzur 2020-09-08
10761774 Forced idling of memory subsystems Olivier Alavoine, Sejoong Lee, Simon Peter William Booth, Edoardo Regini, Renatas Jakushokas +9 more 2020-09-01
10082860 Static image power management Fariborz Pourbigharaz, Carl K. Mizuyabu, Khosro Mohammad Rabii, John Chi Kit Wong, Gary Arthur Ciambella +1 more 2018-09-25
9965220 Forced idling of memory subsystems Olivier Alavoine, Sejoong Lee, Simon Peter William Booth, Edoardo Regini, Renatas Jakushokas +9 more 2018-05-08
9690359 Power multiplexer for integrated circuit power grid efficiency Lipeng Cao, Alain Artieri 2017-06-27
8407037 Methods and apparatus for clock simulation with calibration Lukai Cai, Mahesh Sridharan 2013-03-26
8140316 Systems and methods for improving digital system simulation speed by clock phase gating Haobo Yu, Lukai Cai, Mahesh Sridharan, Viraphol Chaiyakul 2012-03-20
7772831 Systems and methods for testing packaged dies Jeff Gemar, Vaishnav Srinivas, Vivek Mohan 2010-08-10
7437580 Dynamic voltage scaling system Eric L. Henderson, Michael Drop 2008-10-14
7075175 Systems and methods for testing packaged dies Jeff Gemar, Vaishnav Srinivas, Vivek Mohan 2006-07-11