HM

Hisashi Muraoka

PC Purex Co.: 10 patents #1 of 65Top 2%
KT Kabushiki Kaisha Toshiba: 7 patents #4,294 of 21,451Top 25%
NC Nomura Micro Science Co.: 4 patents #3 of 42Top 8%
TE Tokyo Shibaura Electric: 3 patents #11 of 337Top 4%
TC Toshiba Ceramics Co.: 3 patents #54 of 458Top 15%
WI Wako Pure Chemical Industries: 1 patents #164 of 377Top 45%
KC Kakizaki Manufacturing Co.: 1 patents #4 of 8Top 50%
TC Tama Chemicals Co.: 1 patents #18 of 26Top 70%
TO Toshiba: 1 patents #1,121 of 2,688Top 45%
Overall (All Time): #259,826 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6896927 Method of preventing organic contamination from the atmosphere of electronic device substrates and electronic device substrates treated therewith 2005-05-24
6851873 Method and apparatus for removing organic films Rieko Muraoka, Asuka Sato, Mitsuru Endo 2005-02-08
6699330 Method of removing contamination adhered to surfaces and apparatus used therefor 2004-03-02
6696228 Method and apparatus for removing organic films Rieko Muraoka, Asuka Sato, Mitsuru Endo 2004-02-24
6059887 Process for cleaning the interior of semiconductor substrate Hiroshi Tomita, Soichi Nadahara, Norio Kobayashi 2000-05-09
6054373 Method of and apparatus for removing metallic impurities diffused in a semiconductor substrate Hiroshi Tomita, Ryuji Takeda 2000-04-25
5772738 Multifunctional air filter and air-circulating clean unit with the same incorporated therein 1998-06-30
5681398 Silicone wafer cleaning method 1997-10-28
5643404 Method for examination of silicon wafer surface defects Yuji Fukazawa 1997-07-01
5636256 Apparatus used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities Tuyoshi Matumura, Kunihiro Miyazaki 1997-06-03
5635463 Silicon wafer cleaning fluid with HN0.sub.3, HF, HCl, surfactant, and water 1997-06-03
5350489 Treatment method of cleaning surface of plastic molded item 1994-09-27
5290361 Surface treating cleaning method Ichiro Hayashida, Masahiko Kakizawa, Kenichi Umekita, Hiroyoshi Nawa 1994-03-01
5284802 Container for semiconductor wafer sample and method of preparing sample Takeyoshi Kakizaki 1994-02-08
4587928 Apparatus for producing a semiconductor device Toshio Yonezawa 1986-05-13
4515755 Apparatus for producing a silicon single crystal from a silicon melt Shuitsu Matsuo, Yasuhiro Imanishi, Hideo Nagashima, Masaharu Watanabe, Toshiro Usami 1985-05-07
4339340 Surface-treating agent adapted for intermediate products of a semiconductor device Masafumi Asano, Taizo Ohashi, Yuzo Shimazaki 1982-07-13
4239661 Surface-treating agent adapted for intermediate products of a semiconductor device Masafumi Asano, Taizo Ohashi, Yuzo Shimazaki 1980-12-16