Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Minimization of bias temperature instability (BTI) degradation in circuits

Minimization of bias temperature instability (BTI) degradation in circuits

US Patent 9859873 · Granted Jan 2, 2018

Estimated economic value: $1,907,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Asymmetric read-write sequence for interconnected dies2025
Processing unit and method for computing a convolution using a hardware-implemen2023
Multi-port memory architecture for a systolic array2023
Multi-port memory architecture for a systolic array2023
Multi-sense amplifier based access to a single port of a memory cell2023
Multi-sense amplifier based access to a single port of a memory cell2023
Row address comparator for a row redundancy control circuit in a memory2022
Customer-transparent logic redundancy for improved yield2022
High-density high-bandwidth static random access memory (SRAM) with phase shifte2021
Sensing circuits for charge trap transistors2021
Hermetic barrier for semiconductor device2021
Multiple sense amplifier and data path-based pseudo dual port SRAM2021