{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Continuous application and decompression of test patterns and selective compaction of test responses", "item": "https://www.patentleaderboard.com/patent/9664739"}]}
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Continuous application and decompression of test patterns and selective compaction of test responses

US Patent 9664739 · Granted May 30, 2017

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