Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test chip, test board and reliability testing method

Test chip, test board and reliability testing method

US Patent 9508617 · Granted Nov 29, 2016

Estimated economic value: $2,821,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device including cumulative sealing structures2025
Interconnect structures, packaged semiconductor devices, and methods of packagin2024
Magnetic light-emitting structure2023
Plurality of different size metal layers for a pad structure2023
Light-emitting diode packaging structure and method for fabricating the same2023
Semiconductor package and manufacturing process thereof2023
Semiconductor device including cumulative sealing structures and method and syst2023
Magnetic light-emitting structure and fabrication method for manufacturing a mag2023
Alignment module for transferring a magnetic light-emitting die and alignment me2022
Plurality of different size metal layers for a pad structure2022
Semiconductor package and manufacturing process thereof2022
Reliability testing method and apparatus2022