Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Row bar thickness measurement device, system and methods

Row bar thickness measurement device, system and methods

US Patent 9115980 · Granted Aug 25, 2015

Estimated economic value: $8,541,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods of forming an adhesive layer, and related adhesive films and methods and2024
Work piece contact pad with centering feature2016
Lapping carrier2016
Lapping head with a sensor device on the rotating lapping head2016
Ambient temperature ball bond2014
Ambient temperature ball bond2014
Method of controlling localized shape of a data head and for characterizing the 2006
Enhanced endpoint detection for wet etch process control2006
Apparatus for detecting CMP endpoint in acidic slurries2005
Method for detecting CMP endpoint in acidic slurries2005
Enhanced endpoint detection for wet etch process control2005
Endpoint detection in chemical-mechanical polishing of patterned wafers having a2004