{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices", "item": "https://www.patentleaderboard.com/patent/9082875"}]}
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Home › Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices

Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices

US Patent 9082875 · Granted Jul 14, 2015

Estimated economic value: $7,900,000 ⓘ

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