Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under test

Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under test

US Patent 8127186 · Granted Feb 28, 2012

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and system for acquisition of test data2021
Method and system for acquisition of test data2020
Tester with acceleration on memory and acceleration for automatic pattern genera2018
Tester with acceleration for packet building within a FPGA block2017
System and method for device performance characterization in physical and logica2011
Dynamic mask memory for serial scan testing2011
Dynamic mask memory for serial scan testing2011
Apparatus for locating a defect in a scan chain while testing digital logic2010
Apparatus for locating a defect in a scan chain while testing digital logic2010
Single platform electronic tester2007
Dynamically reconfigurable precision signal delay test system for automatic test2006
Single platform electronic tester2006