Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method for device performance characterization in physical and logical domains with AC SCAN testing

System and method for device performance characterization in physical and logical domains with AC SCAN testing

US Patent 8006149 · Granted Aug 23, 2011

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Camera systems for vehicles2024
Automatic control systems for vehicles2020
Automatic control systems for vehicles2019
Test architecture having multiple FPGA based hardware accelerator blocks for tes2018
Automatic control systems for vehicles2018
Efficient low-complexity video compression2017
Automatic control systems for vehicles2016
Automatic signaling system for vehicles2016
Process for improving design-limited yield by localizing potential faults from p2013
Process for improving design-limited yield by localizing potential faults from p2013
Process for improving design limited yield by efficiently capturing and storing 2013
Process for improving design limited yield by efficiently capturing and storing 2013