Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Charged particle beam apparatus and sample manufacturing method

Charged particle beam apparatus and sample manufacturing method

US Patent 7928377 · Granted Apr 19, 2011

Estimated economic value: $115,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Security device for vehicle, security system for vehicle, security method for ve2023
Charged particle beam device, sample observation method, sample platform, observ2019
Method for adjusting charged particle beam device and adjusting beam aperture ba2019
All solid lithium battery2018
Charged particle beam apparatus, specimen observation system and operation progr2018
Charged particle beam apparatus, specimen observation system and operation progr2017
Charged particle beam apparatus, specimen observation system and operation progr2016
Charged particle beam apparatus2015
Charged particle radiation device with bandpass detection2015
Gas field ionization ion source and ion beam device2015
Device for correcting diffraction aberration of electron beam2015
Charged particle beam apparatus2015