Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Design structure for semiconductor on-chip repair scheme for negative bias temperature instability

Design structure for semiconductor on-chip repair scheme for negative bias temperature instability

US Patent 7890893 · Granted Feb 15, 2011

Estimated economic value: $3,434,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electromigration monitor2020
Structures, methods and applications for electrical pulse anneal processes2020
Electromigration monitor2020
Solder bump array probe tip structure for laser cleaning2020
Electrostatic discharge and passive structures integrated in a vertical gate fin2019
Structures, methods and applications for electrical pulse anneal processes2019
Chip joining by induction heating2019
Centering substrates on a chuck2019
Integrated circuit structure with continuous metal crack stop2018
Extrusion-resistant solder interconnect structures and methods of forming2018
Structures, methods and applications for electrical pulse anneal processes2018
Centering substrates on a chuck2018